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Advantest releases memory tester

Flash in the plan
Monday, 17 November 2008, 12:38

ADVANTEST CORPORATION today released its new memory tester, the T5782. Available this month, the T5782 is designed with per-site architecture and industry-leading speeds of 266MHz/533Mbps, and is ideally suited for testing today’s flash memories, as well as future device generations including memory-embedded microcontrollers and rapidly evolving memory bus environments. The T5782's at-speed, at-specification performance meets the requirements of tomorrow's Known Good Die (KGD) and MCP memory solutions.

The system has the ability to simultaneously test up to 256 devices and inherits the advanced technologies and performance features of its predecessor, the T5781, with a footprint half the size. The T5782 also incorporates many Flash functions including ECC and block management, which enable the system to flexibly address diversified needs.

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Targeting the memory circuits of Flash MCUs, the T5782 offers test speed of 266MHz, said to be the fastest speed in the industry. Parallel test capacity has been reduced by 50% compared to the previous model, the T5781, which optimizes the tester's configuration to support rapid generational progress in the Flash MCU segment, and allows for savings on specialized consumable fixturing costs and power consumption. Low running costs facilitate cost-effective Flash MCU production.

The T5782 offers Flash memory and DRAM test capabilities, enabling MCP test in addition to Flash memory wafer and package test.

System pricing begins at ¥77 million and varies depending on configuration. µ

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